DocumentCode
3531670
Title
A Method for Optimum Test Point Selection and Fault Diagnosis Strategy for BIT of Avionic System
Author
Song, Dong ; Hu, Qiong ; Wang, Chuanqing
Author_Institution
Coll. of Aeronaut., Northwestern Polytech. Univ., Xi´´an
fYear
2009
fDate
28-29 April 2009
Firstpage
1
Lastpage
5
Abstract
A method for optimum test point selection and the fault diagnosis strategy which is based on the fault message matrix and features of BIT is proposed. The fault message matrix is divided based on the weight of the test points The diagnosis strategy is determined using dividing the fault message matrix and the thought of detecting first and isolating next. Result shows that the optimum method is suitable for BIT to select the appropriate test points and fault diagnosis procedure. Besides, average numbers of test steps were reduced.
Keywords
aerospace testing; avionics; built-in self test; fault diagnosis; avionic system; fault diagnosis strategy; fault message matrix; optimum test point selection; Aerospace electronics; Automatic testing; Circuit faults; Circuit testing; Educational institutions; Fault detection; Fault diagnosis; Hardware; Software testing; System testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Testing and Diagnosis, 2009. ICTD 2009. IEEE Circuits and Systems International Conference on
Conference_Location
Chengdu
Print_ISBN
978-1-4244-2587-7
Type
conf
DOI
10.1109/CAS-ICTD.2009.4960753
Filename
4960753
Link To Document