• DocumentCode
    3531720
  • Title

    A Framework for TSV Serialization-aware Synthesis of Application Specific 3D Networks-on-Chip

  • Author

    Pasricha, Sudeep

  • Author_Institution
    Colorado State Univ., Fort Collins, CO, USA
  • fYear
    2012
  • fDate
    7-11 Jan. 2012
  • Firstpage
    268
  • Lastpage
    273
  • Abstract
    With increasing performance-per-watt implementation requirements for emerging applications and barriers in interconnect scaling for ultra-deep sub micron (UDSM) technologies, traditional 2D integrated circuits (2D-ICs) are being pushed to their limit. Three dimensional integrated circuits (3D-ICs) have recently emerged as a promising solution that can overcome many of the performance, area, and power concerns in 2D-ICs. In this paper we propose a novel framework (MORPHEUS) for the synthesis of application-specific 3D networks on chip (NoCs). The goal is to generate 3D NoCs that meet application performance constraints while minimizing power dissipation. MORPHEUS incorporates thermal-aware core layout, 3D topology and route generation, and placement of network interfaces (NIs), routers, and serialized vertical through silicon vias (TSVs). Experimental studies on several chip multiprocessor (CMP) applications indicate that our generated solutions notably reduce power dissipation (up to 2.3×) and average latency (up to 1.2×) over 2D NoCs. Comparisons with a previous work on application-specific 3D NoC synthesis also show improvements in power dissipation (up to 1.9×) and average latency (up to 1.6×).
  • Keywords
    integrated circuit interconnections; microprocessor chips; network-on-chip; three-dimensional integrated circuits; 2D integrated circuits; 2D-IC; 3D topology; CMP applications; MORPHEUS; NI; TSV serialization-aware synthesis; UDSM technologies; application specific 3D networks-on-chip synthesis; application-specific 3D NoC synthesis; chip multiprocessor applications; interconnect scaling; network interfaces; performance-per-watt implementation requirements; power dissipation reduction; route generation; serialized vertical through silicon via; three dimensional integrated circuits; ultradeep sub micron technologies; Bandwidth; Layout; Nickel; Power dissipation; Three dimensional displays; Through-silicon vias; 3D; NoC; networks on chip; synthesis;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI Design (VLSID), 2012 25th International Conference on
  • Conference_Location
    Hyderabad
  • ISSN
    1063-9667
  • Print_ISBN
    978-1-4673-0438-2
  • Type

    conf

  • DOI
    10.1109/VLSID.2012.82
  • Filename
    6167763