Title :
A Reliability Circuit Implementation for VLSI with Combined Huffman and CRC Coding
Author :
Dong, Gang ; Yang, Haigang
Author_Institution :
Inst. of Electron., Chinese Acad. of Sci., Beijing
Abstract :
The Cyclic Redundancy Checking (CRC) is widely used in many fields. The error undetected probability of the CRC relies on the length of a CRC code. For a certain format of the code, the error undetected probability is nearly a constant. But more bits of the information take more chances to burst an error. This paper proposes to reduce the error burst probability with an application of the compression theory, Huffman coding. Consequently, more reliable circuits using the CRC coding can be implemented. And a new reliability circuit for VLSI is designed in this paper.
Keywords :
Huffman codes; VLSI; codecs; cyclic redundancy check codes; error statistics; logic circuits; Huffman coding; VLSI; combined Huffman CRC coding; compression theory; cyclic redundancy checking; error burst probability; reliability circuit implementation; Arithmetic; Circuits; Computational efficiency; Constraint optimization; Cyclic redundancy check; Embedded system; Hardware; Huffman coding; Shift registers; Very large scale integration;
Conference_Titel :
Testing and Diagnosis, 2009. ICTD 2009. IEEE Circuits and Systems International Conference on
Conference_Location :
Chengdu
Print_ISBN :
978-1-4244-2587-7
DOI :
10.1109/CAS-ICTD.2009.4960768
