• DocumentCode
    3531953
  • Title

    A Stream-Mode Based HW/SW Co-Emulation System for SOC Test and Verification

  • Author

    Ruan, A.W. ; Liao, Y.B. ; Li, P. ; Wang, Y.W. ; Li, W.C.

  • Author_Institution
    State key Lab. of Electron. Thin Films & Integrated Devices, Univ. of Electron. Sci. & Technol. of China, Chengdu
  • fYear
    2009
  • fDate
    28-29 April 2009
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    With the growing System-on-a-chip (SOC) design complexity, SOC test and verification has become a major bottleneck. In this context, efficient and reliable test and verification system are requested for SOC design before a SOC is committed to production. HW/SW co-emulation system combing software simulation with hardware acceleration is one of dominant systems, where interrupt-based communication mechanism is usually utilized. However, communication overhead will be resulted from data exchange between hardware side and software side at every cycle. A stream-mode based HW/SW co-emulation system is proposed and presented in the paper. In the proposed system, software side sends stimulus data and receives response data continuously while hardware side is testing System-under-Test (SUT) and generating response data. Communication traffic is reduced due to only time spent on software executions with hardware executions, sending and receiving data implemented in parallel. Experiment result demonstrates that stream-based communication mechanism can improve communication throughput by more than 10 folds compared to interrupt-based communication mechanism.
  • Keywords
    hardware-software codesign; integrated circuit testing; system-on-chip; communication traffic; data exchange; hardware-software co-emulation system; interrupt mode; stream-mode; system-on-chip test; system-on-chip verification; Acceleration; Communication system software; Context; Hardware; Production systems; Software systems; Software testing; System testing; System-on-a-chip; Throughput;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Testing and Diagnosis, 2009. ICTD 2009. IEEE Circuits and Systems International Conference on
  • Conference_Location
    Chengdu
  • Print_ISBN
    978-1-4244-2587-7
  • Type

    conf

  • DOI
    10.1109/CAS-ICTD.2009.4960771
  • Filename
    4960771