Accurate Measurement for Surface Resistance of a Single Piece of HTS Thin Film

Author

Zeng, Cheng ; Luo, Zhengxiang ; Yang, Kai ; Zhang, Qishao

Author_Institution

Sch. of Opto-Electron. Inf., Univ. of Electron. Sci. & Technol., Chengdu

fYear

2009

fDate

28-29 April 2009

Firstpage

1

Lastpage

4

Abstract

An improved image type sapphire resonator was developed for accurate measurement of surface resistance of a single piece of high temperature superconductor thin film. The surface resistances of two DC spurting yttrium-barium-copper oxide (YBCO) thin films were measured by TE₀₁₁ mode of this resonator. TE₀₁₂ mode of this resonator was also used in the measurement for the determination of the frequency dependence of the surface resistance of the HTS thin film. The high accuracy in the R_s measurement of this resonator is comparable to the one of conventional two-resonator method, while the process is much simpler. The ability for measuring surface resistance of a single HTS thin film and characterizing the frequency dependence of R_s of this sapphire resonator is remarkable.

Keywords

barium compounds; copper compounds; high-temperature superconductors; sapphire; superconducting thin films; surface resistance; yttrium compounds; Al₂O₃; HTS thin film; YBCO thin films; YBa₂Cu₃O_7-delta; accurate measurement; high temperature superconductor thin film; sapphire resonator; surface resistance; yttrium-barium-copper oxide; Electrical resistance measurement; Frequency dependence; Frequency measurement; High temperature superconductors; Superconducting thin films; Surface resistance; Tellurium; Transistors; Yttrium barium copper oxide; Yttrium compounds;

fLanguage

English

Publisher

ieee

Conference_Titel

Testing and Diagnosis, 2009. ICTD 2009. IEEE Circuits and Systems International Conference on

Conference_Location

Chengdu

Print_ISBN

978-1-4244-2587-7

Type

conf

DOI

10.1109/CAS-ICTD.2009.4960774

Filename

4960774