DocumentCode :
3532008
Title :
Phase Change Memory and paradigm shift to in-system programming
Author :
Wong, Darwin ; Smith, Clifford ; Kale, Poorna
Author_Institution :
Micron Technol., Inc., Folsom, CA, USA
fYear :
2010
fDate :
3-4 Aug. 2010
Firstpage :
371
Lastpage :
374
Abstract :
Phase Change Memory (PCM) has recently gained momentum in the semiconductor industry as a viable alternative to flash memory due to the fact that flash (NOR and NAND) and DRAM memory technologies are expected to encounter scaling difficulties as chip lithography shrinks, and various unique properties PCM offers. The PCM cell has been shown to scale down below 10nm as it uses the unique properties of Chalcogenide glass which can be reversibly “switched” between crystalline (low resistance) and amorphous (high resistance) states with application of heat. This unique temperature property, however, will impose a paradigm shift from off-board pre-programming to in-system programming (ISP) in the manufacturing flow. Any code needed to be stored in the PCM has to be programmed after the surface mount technology (SMT) process. There are several methods already employed in the industry that will facilitate this paradigm shift to in-system programming. This paper attempts to consolidate and describe these methods.
Keywords :
flash memories; phase change memories; surface mount technology; SMT; amorphous state; chalcogenide glass; chip lithography; crystalline state; flash memory; in-system programming; phase change memory; surface mount technology; Amorphous semiconductors; Crystallization; Electronics industry; Flash memory; Glass; Lithography; Phase change materials; Phase change memory; Resistance heating; Surface-mount technology; In-Circuit; In-System Programming; On-Board Programming; Phase Change Memory; Programming;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Quality Electronic Design (ASQED), 2010 2nd Asia Symposium on
Conference_Location :
Penang
Print_ISBN :
978-1-4244-7809-5
Type :
conf
DOI :
10.1109/ASQED.2010.5548306
Filename :
5548306
Link To Document :
بازگشت