DocumentCode
3532190
Title
Application of Rollout Strategy to Test Points Selection for Integer-Coded Fault Wise Table
Author
Yang, ChengLin ; Tian, Shulin ; Long, Bing
Author_Institution
Sch. of Autom. Eng., Univ. of Electron. Sci. & Technol. of China, Chengdu
fYear
2009
fDate
28-29 April 2009
Firstpage
1
Lastpage
4
Abstract
Test points selection for integer-coded fault wise table is a discrete optimization problem. The global minimum set of test points can only be guaranteed by an exhaustive search which is computationally expensive. In this paper, this problem is formulated as a heuristic depth-first graph search problem at first. The graph node expanding method and rules are given. Then, we propose to apply rollout strategies, which can be combined with the heuristic graph search algorithms, in a computationally more efficient manner than the optimal strategies, to obtain solutions superior to those using the greedy heuristic algorithms. The proposed rollout-based test points selection algorithm is illustrated and tested using an analog circuit and a set of simulated integer-coded fault wise tables. We show computational results, which suggest that the rollout strategy policies are significantly better than other strategies.
Keywords
analogue circuits; fault diagnosis; graph theory; search problems; analogue circuits; graph node expanding; heuristic depth-first graph search problem; integer-coded fault wise table; rollout-based test points selection; Circuit faults; Circuit testing; Computational efficiency; Computational modeling; Dictionaries; Fault detection; Fault diagnosis; Heuristic algorithms; Optimized production technology; System testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Testing and Diagnosis, 2009. ICTD 2009. IEEE Circuits and Systems International Conference on
Conference_Location
Chengdu
Print_ISBN
978-1-4244-2587-7
Type
conf
DOI
10.1109/CAS-ICTD.2009.4960788
Filename
4960788
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