Title :
Short-wavelength bottom-emitting vertical-cavity lasers
Author :
Geib, Kent M. ; Choquette, Kent D. ; Hou, H.Q. ; Crawford, M.H. ; Hammons, B.E.
Author_Institution :
Center for Compound Semicond. Technol., Sandia Nat. Labs., Albuquerque, NM, USA
Abstract :
Summary form only given. Bottom-emitting vertical-cavity surface-emitting lasers (VCSELs), which emit through a transparent substrate have several advantages over conventional top-emitting lasers such as accessibility of the laser output at both facets, the ability to fashion optical elements such as lenses into the substrate, and the suitability of this structure to flip-chip bonding for hybrid microelectronic integration. Relatively-long-wavelength VCSELs are required to emit through a GaAs substrate. Currently, bottom-emitting VCSELs at shorter wavelengths appropriate for Si photodetectors rely upon etching deep via holes or removal of the GaAs substrate, both of which can compromise the underlying distributed Bragg reflector mirror. VCSELs at 850-nm grown directly on transparent AlGaAs substrates are to date inferior to those grown on GaAs substrates. We report high-performance 850-nm selectively oxidized VCSEL arrays bonded to GaP and AlGaAs transparent substrates using a simple wafer fusion process to enable emission through the substrate.
Keywords :
III-V semiconductors; etching; gallium arsenide; optical fabrication; semiconductor laser arrays; surface emitting lasers; wafer bonding; 850 nm; AlGaAs; AlGaAs substrates; GaAs; GaP; GaP substrates; anisotropic etching; high-performance; selectively oxidized VCSEL arrays; short-wavelength bottom-emitting VCSEL; transparent substrate; wafer fusion process; Bonding; Gallium arsenide; Integrated optics; Lenses; Microelectronics; Optical surface waves; Photodetectors; Stimulated emission; Surface emitting lasers; Vertical cavity surface emitting lasers;
Conference_Titel :
Lasers and Electro-Optics, 1998. CLEO 98. Technical Digest. Summaries of papers presented at the Conference on
Conference_Location :
San Francisco, CA, USA
Print_ISBN :
1-55752-339-0
DOI :
10.1109/CLEO.1998.676052