Title :
Design of High-Order Sigma-Delta Modulator for BIST of Mixed-Signal Integrated Circuits
Author :
Sun Xiubin ; Xie Yongle ; Liu Shan
Author_Institution :
Dept. of Electron. Eng., Chengdu Univ. of Inf. Technol., Chengdu
Abstract :
A method for design of high-order sigma-delta modulator is proposed to generate high-precision analog signals for Built-In-Self-Test (BIST) of mixed-signal integrated circuits. The noise transfer function of the sigma-delta modulator is achieved by the sigma-delta toolbox. Using Determination Decision Diagram (DDD), symbolic transfer functions of the sigma-delta modulator are represented exactly and efficiently, and are applied to its coefficient quantization. The experiment on 4th-order sigma-delta modulator demonstrates that the in-band noise attenuation can also be kept to a maximum after quantization.
Keywords :
built-in self test; mixed analogue-digital integrated circuits; sigma-delta modulation; transfer functions; BIST; built-in-self-test; determination decision diagram; high-order sigma-delta modulator; high-precision analog signals; mixed-signal integrated circuits; noise transfer function; symbolic transfer functions; Attenuation; Built-in self-test; Delta-sigma modulation; Design methodology; Integrated circuit noise; Mixed analog digital integrated circuits; Quantization; Signal design; Signal generators; Transfer functions;
Conference_Titel :
Testing and Diagnosis, 2009. ICTD 2009. IEEE Circuits and Systems International Conference on
Conference_Location :
Chengdu
Print_ISBN :
978-1-4244-2587-7
DOI :
10.1109/CAS-ICTD.2009.4960804
