Title :
Evolution of the design of a second generation FireWire based data acquisition system
Author :
Lewellen, T.K. ; Miyaoka, R.S. ; MacDonald, L.R. ; DeWitt, D. ; Haselman, M. ; Hauck, S.
Author_Institution :
Dept. of Radiol., Univ. of Washington, Seattle, WA, USA
fDate :
Oct. 30 2010-Nov. 6 2010
Abstract :
Our laboratory has previously reported on the basic design concepts of an updated FireWire based data acquisition system for depth-of-interaction detector systems designed at the University of Washington. The new version of our data acquisition system leverages the capabilities of modern field programmable gate arrays (FPGA) and puts almost all functions into the FPGA, including the FireWire elements, the embedded processor, and pulse timing and integration. The design is centered around an acquisition node board (ANB) that includes 64 serial ADC channels, one high speed parallel ADC, FireWire 1394b support, the FPGA, a serial command bus and signal lines to support a rough coincidence window implementation to reject singles events from being sent on the FireWire bus. Adapter boards convert detector signals into differential paired signals to connect to the ANB. In this paper we discuss many of the design details, including steps taken to minimize the number of layers in the printed circuit board and to avoid skewing of parallel signals and unwanted bandwidth limitations.
Keywords :
analogue-digital conversion; data acquisition; field programmable gate arrays; positron emission tomography; printed circuits; ADC channels; FPGA; acquisition node board; adapter boards; bandwidth limitations; data acquisition system; depth-of-interaction detector systems; embedded processor; field programmable gate arrays; printed circuit board; pulse timing; rough coincidence window; second generation fire wire; serial command bus; signal skewing; Connectors; Detectors; Field programmable gate arrays; IEEE 1394 Standard; Layout; Positron emission tomography; Timing;
Conference_Titel :
Nuclear Science Symposium Conference Record (NSS/MIC), 2010 IEEE
Conference_Location :
Knoxville, TN
Print_ISBN :
978-1-4244-9106-3
DOI :
10.1109/NSSMIC.2010.5874239