DocumentCode
3532939
Title
Method of Testability Index Determination Based on Generalized Stochastic Petri Net
Author
Su Yongding ; Qiu Jing ; Liu Guanjun ; Xu Yuguo ; Qian Yanling
Author_Institution
Coll. of Mechatronical Eng. & Autom., Nat. Univ. of Defense Technol., Changsha
fYear
2009
fDate
28-29 April 2009
Firstpage
1
Lastpage
4
Abstract
As an important performance of equipment system, testability is always omitted in the traditional availability analysis. Testability design is an effective way to realize the fault detection and isolation. Determining testability index is the chief step of testability design. It needs to consider the influence factors of testability such as the requirement of system availability, reliability, maintainability, supportability and so on. A testability requirement analysis model is built based on generalized stochastic Petri nets (GSPN), which is used to determinate testability index. The reachable states are analyzed based on the model and the Markov chain is constructed. The state transition matrix is created and the system steady state probability is gained. The relationship between the steady state availability and testability parameters was revealed and the testability parameters are reasoned. The validation results of an example show that the method is an effective method to determine testability index such as fault detection rate and fault isolation rate.
Keywords
Markov processes; Petri nets; maintenance engineering; matrix algebra; testing; Markov chain; equipment system; fault detection; fault isolation; generalized stochastic Petri net; generalized stochastic Petri nets; steady state probability; testability index determination methods; testability requirement analysis; Availability; Fault detection; Life testing; Maintenance; Petri nets; Steady-state; Stochastic processes; Stochastic systems; System performance; System testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Testing and Diagnosis, 2009. ICTD 2009. IEEE Circuits and Systems International Conference on
Conference_Location
Chengdu
Print_ISBN
978-1-4244-2587-7
Type
conf
DOI
10.1109/CAS-ICTD.2009.4960839
Filename
4960839
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