• DocumentCode
    3532939
  • Title

    Method of Testability Index Determination Based on Generalized Stochastic Petri Net

  • Author

    Su Yongding ; Qiu Jing ; Liu Guanjun ; Xu Yuguo ; Qian Yanling

  • Author_Institution
    Coll. of Mechatronical Eng. & Autom., Nat. Univ. of Defense Technol., Changsha
  • fYear
    2009
  • fDate
    28-29 April 2009
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    As an important performance of equipment system, testability is always omitted in the traditional availability analysis. Testability design is an effective way to realize the fault detection and isolation. Determining testability index is the chief step of testability design. It needs to consider the influence factors of testability such as the requirement of system availability, reliability, maintainability, supportability and so on. A testability requirement analysis model is built based on generalized stochastic Petri nets (GSPN), which is used to determinate testability index. The reachable states are analyzed based on the model and the Markov chain is constructed. The state transition matrix is created and the system steady state probability is gained. The relationship between the steady state availability and testability parameters was revealed and the testability parameters are reasoned. The validation results of an example show that the method is an effective method to determine testability index such as fault detection rate and fault isolation rate.
  • Keywords
    Markov processes; Petri nets; maintenance engineering; matrix algebra; testing; Markov chain; equipment system; fault detection; fault isolation; generalized stochastic Petri net; generalized stochastic Petri nets; steady state probability; testability index determination methods; testability requirement analysis; Availability; Fault detection; Life testing; Maintenance; Petri nets; Steady-state; Stochastic processes; Stochastic systems; System performance; System testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Testing and Diagnosis, 2009. ICTD 2009. IEEE Circuits and Systems International Conference on
  • Conference_Location
    Chengdu
  • Print_ISBN
    978-1-4244-2587-7
  • Type

    conf

  • DOI
    10.1109/CAS-ICTD.2009.4960839
  • Filename
    4960839