DocumentCode
3533118
Title
Optimal Test Points Selection Based on Multi-Objective Genetic Algorithm
Author
Zhang, Yong ; Chen, Xixiang ; Liu, Guanjun ; Qiu, Jing ; Yang, Shuming
Author_Institution
Coll. of Mechatronical Eng. & Autom., Nat. Univ. of Defense Technolog, Changsha
fYear
2009
fDate
28-29 April 2009
Firstpage
1
Lastpage
4
Abstract
A new approach to select an optimal set of test points is proposed. The described method uses fault-wise table and multi-objective genetic algorithm to find the optimal set of test points. First, the fault-wise table is constructed whose entries are measurements associated with faults and test points. The problem of optimal test points selection is transformed to the selection of the columns that isolate the rows of the table. Then, four objectives are described according to practical test requirements. The multi-objective genetic algorithm is explained. Finally, the presented approach is illustrated by a practical example. The results indicate that the proposed method efficiently and accurately finds the optimal set of test points and is practical for large scale systems.
Keywords
design for testability; genetic algorithms; design for testability; fault-wise table; multi-objective genetic algorithm; optimal test points selection; Automatic testing; Circuit faults; Circuit testing; Cost function; Design for testability; Dictionaries; Fault diagnosis; Genetic algorithms; System testing; Test equipment;
fLanguage
English
Publisher
ieee
Conference_Titel
Testing and Diagnosis, 2009. ICTD 2009. IEEE Circuits and Systems International Conference on
Conference_Location
Chengdu
Print_ISBN
978-1-4244-2587-7
Type
conf
DOI
10.1109/CAS-ICTD.2009.4960850
Filename
4960850
Link To Document