• DocumentCode
    3533118
  • Title

    Optimal Test Points Selection Based on Multi-Objective Genetic Algorithm

  • Author

    Zhang, Yong ; Chen, Xixiang ; Liu, Guanjun ; Qiu, Jing ; Yang, Shuming

  • Author_Institution
    Coll. of Mechatronical Eng. & Autom., Nat. Univ. of Defense Technolog, Changsha
  • fYear
    2009
  • fDate
    28-29 April 2009
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    A new approach to select an optimal set of test points is proposed. The described method uses fault-wise table and multi-objective genetic algorithm to find the optimal set of test points. First, the fault-wise table is constructed whose entries are measurements associated with faults and test points. The problem of optimal test points selection is transformed to the selection of the columns that isolate the rows of the table. Then, four objectives are described according to practical test requirements. The multi-objective genetic algorithm is explained. Finally, the presented approach is illustrated by a practical example. The results indicate that the proposed method efficiently and accurately finds the optimal set of test points and is practical for large scale systems.
  • Keywords
    design for testability; genetic algorithms; design for testability; fault-wise table; multi-objective genetic algorithm; optimal test points selection; Automatic testing; Circuit faults; Circuit testing; Cost function; Design for testability; Dictionaries; Fault diagnosis; Genetic algorithms; System testing; Test equipment;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Testing and Diagnosis, 2009. ICTD 2009. IEEE Circuits and Systems International Conference on
  • Conference_Location
    Chengdu
  • Print_ISBN
    978-1-4244-2587-7
  • Type

    conf

  • DOI
    10.1109/CAS-ICTD.2009.4960850
  • Filename
    4960850