• DocumentCode
    3533210
  • Title

    Process Simulation and Analysis for PIN Detector

  • Author

    Shrivastava, Samichi ; Henry, Rabinder

  • Author_Institution
    MS VLSI Design & Microelectron., Int. Inst. of Inf. Technol., Pune
  • fYear
    2009
  • fDate
    28-29 April 2009
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    Bhabha Atomic Research Centre has been exploring some of the unique features of silicon detector in a variety of nuclear structure experiment using high energy photons and heavy ions projectiles. Current experimental application makes use of large area silicon detector with depletion thickness of ~150-1000 mum. The low cost silicon detector shows excellent energy and position resolution. In this paper, we discuss the simulation result for silicon detector using SILVACO and the physical mechanism involved in detector operation and one set of mask designing for the silicon radiation detector then we will clarify how these effects set a limit to achievable timing performance.
  • Keywords
    elemental semiconductors; p-i-n photodiodes; particle detectors; silicon; Bhabha Atomic Research Centre; PIN detector; SILVACO; Si; heavy ions projectiles; high energy photons; nuclear structure experiment; process simulation; silicon detector; silicon radiation detector; Analytical models; Diodes; Energy resolution; Face detection; Information technology; Microelectronics; Radiation detectors; Silicon radiation detectors; Spectroscopy; Very large scale integration;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Testing and Diagnosis, 2009. ICTD 2009. IEEE Circuits and Systems International Conference on
  • Conference_Location
    Chengdu
  • Print_ISBN
    978-1-4244-2587-7
  • Type

    conf

  • DOI
    10.1109/CAS-ICTD.2009.4960857
  • Filename
    4960857