• DocumentCode
    3533286
  • Title

    Current mismatch during switching due to the self-turn-off effect in paralleled IGBT

  • Author

    Bohmer, Jurgen ; Schumann, Jorg ; Fleisch, Karl ; Eckel, Hans-Gunter

  • Author_Institution
    Inst. of Electr. Power Eng., Univ. of Rostock, Rostock, Germany
  • fYear
    2013
  • fDate
    2-6 Sept. 2013
  • Firstpage
    1
  • Lastpage
    9
  • Abstract
    IGBT are the most important power semiconductor in high power converter [1,2,3,4] up to the MW range. To reduce the switching losses, Field-Stop-IGBTs are used in high voltage applications in comparison with Non-Punch-Through-IGBTs [5]. To increase the current carrying capacity of converters, for example in high power traction applications, it is common to connect IGBTs in parallel. Gate drive circuits for paralleled IGBTs often use separate gate resistors for each IGBT [6,7,8] to avoid oscillations between the gates of these IGBTs. This decoupling of the gates may lead to a complete current mismatch during turn-off of field-stop IGBTs. The reason for this is the self-turn-off of the IGBT, whose space-charge-region (SCR) reaches the field-stop layer at first. To explain the effect of current mismatch of paralleled IGBTs it is important to understand the self-turn-off process and what happens, if an IGBT reaches the field-stop layer during turn-off. Under some conditions it is possible that the IGBT gets a parasitic turn-on behavior if the electrical field becomes trapezoidal. This paper explains these two effects and translate the results to the current mismatch of paralleled IGBTs.
  • Keywords
    insulated gate bipolar transistors; power convertors; power semiconductor devices; current carrying capacity; current mismatch; field-stop-IGBT; gate drive circuits; high power converter; high voltage applications; nonpunch-through-IGBT; paralleled IGBT; power semiconductor; self-turn-off effect; space-charge-region; switching losses; Capacitance; Electron traps; Insulated gate bipolar transistors; Logic gates; Space charge; Threshold voltage; Transient analysis; IGBT; MOS device; Parallel operation;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Power Electronics and Applications (EPE), 2013 15th European Conference on
  • Conference_Location
    Lille
  • Type

    conf

  • DOI
    10.1109/EPE.2013.6631771
  • Filename
    6631771