DocumentCode :
3533366
Title :
Bipolar reverse recovery behavior of the body-diode of a SiC JFET
Author :
Appel, Tobias ; Eckel, Hans-Gunter
Author_Institution :
Inst. of Electr. Power Eng., Univ. of Rostock, Rostock, Germany
fYear :
2013
fDate :
2-6 Sept. 2013
Firstpage :
1
Lastpage :
6
Abstract :
This paper investigates the parasitic turn on during the reverse recovery of the body diode of the normally on 1200 V SiC JFET. During the reverse recovery flows a hole current through the space charge region. The hole current is increasing the charge in the space charge region and the gradient of electrical field increases. A higher gradient of electrical field with the same switching speed causes a higher current through the miller capacitance. Due to this there is a increase in parasitic turn-on. This theory is confirmed by the analyses of experiments.
Keywords :
diodes; junction gate field effect transistors; silicon compounds; JFET; SiC; bipolar reverse recovery behavior; body diode; electrical field gradient; hole current; miller capacitance; parasitic turn-on; reverse recovery flows; space charge region; switching speed; Capacitance; Current measurement; Logic gates; Plasma temperature; Switches; Temperature measurement; Body Diode; JFET; Reverse Recovery; Silicon Carbide (SiC);
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Power Electronics and Applications (EPE), 2013 15th European Conference on
Conference_Location :
Lille
Type :
conf
DOI :
10.1109/EPE.2013.6631777
Filename :
6631777
Link To Document :
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