• DocumentCode
    3533366
  • Title

    Bipolar reverse recovery behavior of the body-diode of a SiC JFET

  • Author

    Appel, Tobias ; Eckel, Hans-Gunter

  • Author_Institution
    Inst. of Electr. Power Eng., Univ. of Rostock, Rostock, Germany
  • fYear
    2013
  • fDate
    2-6 Sept. 2013
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    This paper investigates the parasitic turn on during the reverse recovery of the body diode of the normally on 1200 V SiC JFET. During the reverse recovery flows a hole current through the space charge region. The hole current is increasing the charge in the space charge region and the gradient of electrical field increases. A higher gradient of electrical field with the same switching speed causes a higher current through the miller capacitance. Due to this there is a increase in parasitic turn-on. This theory is confirmed by the analyses of experiments.
  • Keywords
    diodes; junction gate field effect transistors; silicon compounds; JFET; SiC; bipolar reverse recovery behavior; body diode; electrical field gradient; hole current; miller capacitance; parasitic turn-on; reverse recovery flows; space charge region; switching speed; Capacitance; Current measurement; Logic gates; Plasma temperature; Switches; Temperature measurement; Body Diode; JFET; Reverse Recovery; Silicon Carbide (SiC);
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Power Electronics and Applications (EPE), 2013 15th European Conference on
  • Conference_Location
    Lille
  • Type

    conf

  • DOI
    10.1109/EPE.2013.6631777
  • Filename
    6631777