DocumentCode
3533366
Title
Bipolar reverse recovery behavior of the body-diode of a SiC JFET
Author
Appel, Tobias ; Eckel, Hans-Gunter
Author_Institution
Inst. of Electr. Power Eng., Univ. of Rostock, Rostock, Germany
fYear
2013
fDate
2-6 Sept. 2013
Firstpage
1
Lastpage
6
Abstract
This paper investigates the parasitic turn on during the reverse recovery of the body diode of the normally on 1200 V SiC JFET. During the reverse recovery flows a hole current through the space charge region. The hole current is increasing the charge in the space charge region and the gradient of electrical field increases. A higher gradient of electrical field with the same switching speed causes a higher current through the miller capacitance. Due to this there is a increase in parasitic turn-on. This theory is confirmed by the analyses of experiments.
Keywords
diodes; junction gate field effect transistors; silicon compounds; JFET; SiC; bipolar reverse recovery behavior; body diode; electrical field gradient; hole current; miller capacitance; parasitic turn-on; reverse recovery flows; space charge region; switching speed; Capacitance; Current measurement; Logic gates; Plasma temperature; Switches; Temperature measurement; Body Diode; JFET; Reverse Recovery; Silicon Carbide (SiC);
fLanguage
English
Publisher
ieee
Conference_Titel
Power Electronics and Applications (EPE), 2013 15th European Conference on
Conference_Location
Lille
Type
conf
DOI
10.1109/EPE.2013.6631777
Filename
6631777
Link To Document