Title :
Modeling test cost of ownership
Abstract :
Increasing cost of test is a major semiconductor industry issue. This report discusses the total life-cycle cost for a set of test equipment required to test one product or test equipment cost of ownership (COO). This is one of many cost control methods used by the semiconductor industry. Modeling test equipment cost of ownership provides an important tool for identifying, measuring, and responding to the challenges of increasing test cost
Keywords :
Circuit testing; Costing; Costs; Electronics industry; Life testing; Process control; Semiconductor device manufacture; Semiconductor device packaging; Semiconductor device testing; Test equipment;
Conference_Titel :
Economics of Design, Test, and Manufacturing, 1994. Proceedings., Third International Conference on the
Conference_Location :
Austin, TX, USA
Print_ISBN :
0-8186-6595-5
DOI :
10.1109/ICEDTM.1994.496087
