Title :
The Impact of MBUs on the Reliability of Rollback Recovery Circuits
Author :
Huang, Zhengfeng ; Liang, Huaguo
Author_Institution :
Sch. of Comput. & Inf., Hefei Univ. of Technol., Hefei
Abstract :
With technology scaling, radiation induced soft errors have become a serious issue for both aero and terrestrial applications. To mitigate soft errors induced by radiation, rollback recovery is one of the most commonly used techniques. In this paper, a model that deals with Multiple Bit Upsets (MBUs) is proposed to study the impact of MBUs on the reliability of rollback recovery circuits, by calculating the soft error rate of 180 nm devices. The simulations at ground level and at high latitude show that the rollback recovery circuits suffering MBUs can effectively mitigate soft errors.
Keywords :
circuit reliability; error analysis; aero application; multiple bit upsets; radiation induced soft errors; rollback recovery circuit reliability; soft error mitigation; soft error rate; technology scaling; terrestrial application; Alpha particles; Application software; Circuit simulation; Computational modeling; Computer errors; Error analysis; Hardware; Integrated circuit reliability; Neutrons; Redundancy;
Conference_Titel :
Testing and Diagnosis, 2009. ICTD 2009. IEEE Circuits and Systems International Conference on
Conference_Location :
Chengdu
Print_ISBN :
978-1-4244-2587-7
DOI :
10.1109/CAS-ICTD.2009.4960892
