DocumentCode :
353378
Title :
Assessing the impact of melt and refreeze on SSM/I derived North American Prairie snow water equivalent
Author :
Derksen, C. ; LeDrew, E.
Author_Institution :
Waterloo Lab. for Earth Obs., Waterloo Univ., Ont., Canada
Volume :
2
fYear :
2000
fDate :
2000
Firstpage :
454
Abstract :
The passive microwave time series provides ideal imagery for investigating terrestrial snow cover because of all-weather imaging, rapid scene revisit, and the ability to derive quantitative estimates of snow water equivalent (SWE). Metamorphism of snowpack structure, driven by melting and refreezing of the snowpack can, however, cause regional errors in the estimation of SWE by passive microwave technology. The purpose of this study is to assess the utility of surface air temperature data for isolating measurement intervals when passive microwave retrieved SWE is likely to be biased because of the physical state of the snowpack. Ten winter seasons (December, January, February 1988/89 through 1997/98) of air temperature data are filtered to identify a range of melt and refreeze conditions for a North American Prairie study area. Five day averaged (pentad) Special Sensor Microwave/Imager (SSM/I) derived SWE imagery are subsequently investigated to identify any systematic response in measured SWE
Keywords :
hydrological techniques; radiometry; remote sensing; snow; AD 1988 to 1998; Canada; North America; SSM/I; Special Sensor Microwave/Imager; USA; United States; aged snow; aging; grassland; hydrology; measurement technique; melt; melting; microwave radiometry; prairie; refreeze; refreezing; remote sensing; satellite remote sensing; snow cover; snow water equivalent; snowcover; snowpack; winter; Estimation error; Information retrieval; Isolation technology; Layout; Microwave imaging; Microwave measurements; Microwave technology; Snow; Temperature distribution; Temperature sensors;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Geoscience and Remote Sensing Symposium, 2000. Proceedings. IGARSS 2000. IEEE 2000 International
Conference_Location :
Honolulu, HI
Print_ISBN :
0-7803-6359-0
Type :
conf
DOI :
10.1109/IGARSS.2000.861594
Filename :
861594
Link To Document :
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