Title :
Cubic fluorite yttria stabilized zirconia (YSZ) film synthesis by combustion chemical vapour deposition(C-CVD)
Author :
Dhonge, Bahan P. ; Mathews, Tom ; Rajagopalan, S. ; Dash, S. ; Dhara, S. ; Tyagi, A.K.
Author_Institution :
Surface & Nanosci. Div., Indira Gandhi Centre for Atomic Res., Kalpakkam, India
Abstract :
Thin films of yttria stabilized zirconia corresponding to 0-12 mol % yttria were synthesized by combustion chemical vapour deposition technique in the temperature range of 900 - 1100°C on quartz substrate. Zirconium (IV) 2-ethyhexanoate and yttrium (III) 2-ethylhexanoate were used as the precursors. Cubic (c) fluorite structures of YSZ were formed at 8 and 12 % yttria addition. Monoclinic (m) and tetragonal (t) structures are observed for pure and 4% yttria doped zirconia, respectively. Coagulation of clusters of nano crystallites (~100 nm) to large grains resulting in relatively dense film was observed with increase in deposition temperature form 900 to 1100°C. The increase in doping concentration of yttria led to micro-cracking and eventual buckling of the film. Structural disorder induced by oxygen vacancy in the YSZ films was confirmed using laser Raman spectroscopy.
Keywords :
Raman spectra; buckling; chemical vapour deposition; combustion synthesis; crystallites; doping profiles; grain size; microcracks; thin films; yttrium compounds; zirconium compounds; C-CVD; SiO2; Y2O3-ZrO2; buckling; combustion chemical vapour deposition; cubic fluorite yttria stabilized zirconia film; doping concentration; laser Raman spectroscopy; microcracking; nanocrystallites; oxygen vacancy; quartz substrate; structural disorder; temperature 900 degC to 1100 degC; yttrium 2-ethylhexanoate; zirconium 2-ethyhexanoate; Atmospheric measurements; Atomic measurements; Combustion; Films; Substrates; Surface morphology; Surface treatment; Combustion CVD; Raman spectra; Y2O3 doping effect; yttria stabilized zirconia;
Conference_Titel :
Nanoscience, Engineering and Technology (ICONSET), 2011 International Conference on
Conference_Location :
Chennai
Print_ISBN :
978-1-4673-0071-1
DOI :
10.1109/ICONSET.2011.6167913