Title :
Dynamic Markov Model for reliability evaluation of power electronic systems
Author :
Ranjbar, Amir Hossein ; Kiani, Morgan ; Fahimi, Babak
Author_Institution :
Univ. of Texas at Dallas (UTD), Dallas, TX, USA
Abstract :
In this paper, existing methods for reliability evaluation of power electronic systems at system level are reviewed. Then Dynamic Markov Model (DMM) for reliability evaluation of power electronic system is proposed to solve the shortcomings associated with the existing methods. In order to show the effectiveness of the proposed method, reliability of a Boost Power Factor Correction (PFC) circuit is evaluated. To show the advantage of the proposed method, DMM is compared with the conventional Markov model. Based on the comparison results it is shown that DMM can result in a more trustable metric value for reliability of the system.
Keywords :
Markov processes; failure analysis; power electronics; power factor correction; power system reliability; boost power factor correction circuit; dynamic Markov model; power electronic system; reliability evaluation; Circuit faults; Integrated circuit modeling; Integrated circuit reliability; Markov processes; Mathematical model; Power electronics; Dynamic Markov Model (DMM); Failure rate;
Conference_Titel :
Power Engineering, Energy and Electrical Drives (POWERENG), 2011 International Conference on
Conference_Location :
Malaga
Print_ISBN :
978-1-4244-9845-1
Electronic_ISBN :
2155-5516
DOI :
10.1109/PowerEng.2011.6036439
