DocumentCode :
3534236
Title :
Test trade-offs for different dynamic testing techniques for analog and mixed-signal circuits
Author :
Nagi, Naveena ; Abraham, Jacob A.
fYear :
1994
fDate :
16-17 May 1994
Firstpage :
142
Abstract :
Several methods for testing the dynamic characteristics and the frequency response of analog and mixed-signal circuits include input excitations consisting of single or multiple sine waves, pulses, pseudo/white noise or normal operating signals. These techniques differ widely in the test measurement time and the data processing time required for the frequency response characterization, as well as in their effectiveness for detecting errors. This paper provides a comparative study of the different dynamic testing techniques in terms of the measurement and analysis times as well as test effectiveness
Keywords :
Circuit faults; Circuit testing; Costs; Fourier transforms; Frequency response; Logic testing; Medical tests; Sequential analysis; Time measurement; Vehicle dynamics;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Economics of Design, Test, and Manufacturing, 1994. Proceedings., Third International Conference on the
Conference_Location :
Austin, TX, USA
Print_ISBN :
0-8186-6595-5
Type :
conf
DOI :
10.1109/ICEDTM.1994.496102
Filename :
496102
Link To Document :
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