Improved perpendicular anisotropy and permanent magnet properties in Co-doped Nd-Fe-B films multilayered with Ta

Author

Uehara, M. ; Gennai, N. ; Fujiwara, M. ; Tanaka, T.

Author_Institution

NEOMAX Co., Ltd., Osaka, Japan

fYear

2005

fDate

4-8 April 2005

Firstpage

931

Lastpage

932

Abstract

Multilayered films consisting of Nd-FeCo-B/Ta bilayers are prepared using magnetron sputtering and doped with Co. The hard magnetic properties are measured using vibrating sample magnetometer. The phase characterization and evaluation of the crystal alignment were carried out by X-ray diffraction (XRD) measurements. A scanning transmission electron microscopy (STEM) equipped with energy dispersive X-ray analyzer (EDX) was used for the microstructural observation and chemical analysis.

Keywords

X-ray chemical analysis; X-ray diffraction; boron alloys; cobalt; coercive force; crystal microstructure; doping; ferromagnetic materials; iron alloys; magnetic multilayers; neodymium alloys; permanent magnets; perpendicular magnetic anisotropy; remanence; sputter deposition; tantalum; texture; transmission electron microscopy; Co-doped Nd-Fe-B films; NdFeCoB-Ta; X-ray diffraction; bilayers; chemical analysis; crystal alignment; energy dispersive X-ray analyzer; hard magnetic properties; magnetron sputtering; microstructure; multilayered film; permanent magnet properties; perpendicular anisotropy; scanning electron microscopy; vibrating sample magnetometer; Anisotropic magnetoresistance; Chemical analysis; Crystal microstructure; Magnetic films; Magnetic properties; Magnetometers; Permanent magnets; Sputtering; Vibration measurement; X-ray diffraction;

fLanguage

English

Publisher

ieee

Conference_Titel

Magnetics Conference, 2005. INTERMAG Asia 2005. Digests of the IEEE International

Print_ISBN

0-7803-9009-1

Type

conf

DOI

10.1109/INTMAG.2005.1463894

Filename

1463894