Title :
Polarization resolved reflections from ordered and bunched silicon nanowire arrays
Author :
Khorasaninejad, M. ; Saini, S.S.
Author_Institution :
Dept. of Electr. & Comput. Eng., Univ. of Waterloo, Waterloo, ON, Canada
Abstract :
Polarization-resolved reflections from ordered and bunched silicon nanowire arrays are measured. Reflections reduce considerably for bunched nanowires for the p-polarized input while not changing considerably for the s-polarized input between the ordered and bunched nanowires.
Keywords :
arrays; elemental semiconductors; light polarisation; nanophotonics; nanowires; reflection; semiconductor quantum wires; silicon; Si; bunched silicon nanowire arrays; ordered silicon nanowire arrays; p-polarized input; polarization-resolved reflections; s-polarized input; Absorption; Educational institutions; Nanotechnology; Optimized production technology; Reflection; Silicon; Wavelength measurement;
Conference_Titel :
Optical MEMS and Nanophotonics (OMN), 2012 International Conference on
Conference_Location :
Banff, AB
Print_ISBN :
978-1-4577-1511-2
DOI :
10.1109/OMEMS.2012.6318861
