DocumentCode :
3534571
Title :
Dispersion measurements of optical materials using white light interferometry
Author :
Van Engen, A.G. ; Diddams, S.A. ; Clement, T.S.
Author_Institution :
Joint Inst. for Lab. Astrophys., Colorado Univ., Boulder, CO, USA
fYear :
1998
fDate :
3-8 May 1998
Firstpage :
211
Abstract :
Summary form only given. Because of the broad bandwidth of femtosecond laser pulses, dispersion coefficients are important parameters in femtosecond pulse propagation. Dispersion coefficients of dielectrics and nonlinear materials such as barium borate (BBO) are measured over an extended wavelength range, and improved equations are sought for these materials. Using a white light Michelson interferometer, we measure dispersion coefficients of materials placed in one arm of the interferometer for wavelengths from 0.4-1.1 /spl mu/m.
Keywords :
Michelson interferometers; high-speed optical techniques; laser beams; light interferometry; nonlinear optics; optical dispersion; optical materials; barium borate; dielectrics; dispersion coefficients; dispersion measurements; extended wavelength range; femtosecond laser pulses; femtosecond pulse propagation; nonlinear materials; optical materials; white light Michelson interferometer; white light interferometry; Bandwidth; Dielectric materials; Dielectric measurements; Dispersion; Optical interferometry; Optical materials; Optical propagation; Optical pulses; Ultrafast optics; Wavelength measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Lasers and Electro-Optics, 1998. CLEO 98. Technical Digest. Summaries of papers presented at the Conference on
Conference_Location :
San Francisco, CA, USA
Print_ISBN :
1-55752-339-0
Type :
conf
DOI :
10.1109/CLEO.1998.676068
Filename :
676068
Link To Document :
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