DocumentCode :
3534633
Title :
Phase noise in a back-gate biased low-voltage VCO
Author :
Kazemeini, Mehdi H. ; Deen, M. Jamal ; Naseh, Susan
Author_Institution :
Dept. of Electr. & Comput. Eng., McMaster Univ., Hamilton, Ont., Canada
Volume :
1
fYear :
2003
fDate :
25-28 May 2003
Abstract :
The phase noise in an ultra low-power and low-voltage CMOS voltage controlled oscillator (VCO) has been measured and modelled for supply voltage VDD from 1.8 V down to 80 mV with various body bias voltages VBS. The VCO is a fully integrated ring oscillator designed in a 0.18 μm CMOS technology. In this design, the frequency can be controlled by VBS. The effects of scaling VDD together with the effect of VBS on the phase noise are examined experimentally and theoretically. It has been observed that the phase noise at VDD >0.5 V is dominated by the upconverted 1/f noise. But the low frequency noise disappears when VDD decreases below 0.5 V. Application of forward body bias voltages from 0 to 0.6 V also provides a practical method to suppress the low frequency noise being upconverted to phase noise.
Keywords :
1/f noise; CMOS integrated circuits; integrated circuit noise; low-power electronics; network analysis; phase noise; voltage-controlled oscillators; 0 to 0.6 V; 0.18 micron; 80 mV to 1.8 V; CMOS VCO; CMOS voltage controlled oscillator; LF noise suppression; back-gate biased LV VCO; forward body bias voltages; frequency control; integrated ring oscillator; low frequency noise; low-voltage VCO; phase noise; ultra low-power VCO; upconverted 1/f noise; CMOS technology; Frequency; Low-frequency noise; Noise measurement; Phase measurement; Phase noise; Ring oscillators; Semiconductor device modeling; Voltage; Voltage-controlled oscillators;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Circuits and Systems, 2003. ISCAS '03. Proceedings of the 2003 International Symposium on
Print_ISBN :
0-7803-7761-3
Type :
conf
DOI :
10.1109/ISCAS.2003.1205660
Filename :
1205660
Link To Document :
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