• DocumentCode
    3534670
  • Title

    A high resolution scintillator based SPECT detector with digital pulse processing (SPECTatress)

  • Author

    Deprez, Karel ; Van Holen, Roel ; Staelens, Steven ; Vandenberghe, Stefaan

  • Author_Institution
    Med. Image & Signal Process. Group, Ghent Univ. - IBBT, Ghent, Belgium
  • fYear
    2010
  • fDate
    Oct. 30 2010-Nov. 6 2010
  • Firstpage
    3100
  • Lastpage
    3104
  • Abstract
    SPECT scanners using multi-pinhole collimators benefit from modular detectors having a high spatial resolution. Such detectors can be placed closer to the collimator and perpendicular to the pinhole axis (thereby limiting DOI spatial resolution degradation). Current clinical gamma ray cameras have a large area and a poor spatial resolution. This proceeding describes the architecture of SPECTatress, a modular high resolution gamma camera. A brief summary of the electronics and results obtained with the center-of-gravity positioning algorithm have been presented previously (Imaging 2010 conference, Stockholm). Here we present a detailed overview of the pre-amplifiers and the algorithms used in the FPGA. Results using a GPU accelerated MLE algorithm are shown. This measurement indicates a spatial resolution of 1.1mm FWHM in the center of the detector and an energy resolution of 9% FWHM.
  • Keywords
    maximum likelihood estimation; medical image processing; scintillation; single photon emission computed tomography; GPU accelerated MLE algorithm; SPECT scanners; center-of-gravity positioning algorithm; clinical gamma ray cameras; digital pulse processing; energy resolution; high resolution scintillator based SPECT detector; high spatial resolution; modular detectors; modular high resolution gamma camera; multipinhole collimators; pinhole axis; Calibration; Cameras; Collimators; Detectors; Energy resolution; Maximum likelihood estimation; Spatial resolution;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nuclear Science Symposium Conference Record (NSS/MIC), 2010 IEEE
  • Conference_Location
    Knoxville, TN
  • ISSN
    1095-7863
  • Print_ISBN
    978-1-4244-9106-3
  • Type

    conf

  • DOI
    10.1109/NSSMIC.2010.5874371
  • Filename
    5874371