DocumentCode
35347
Title
Datasheet Driven Silicon Carbide Power MOSFET Model
Author
Mudholkar, Mihir ; Ahmed, Shehab ; Ericson, M. Nance ; Frank, S. Shane ; Britton, Charles L. ; Mantooth, Homer Alan
Author_Institution
Stand. Products Group, ON Semicond., Phoenix, AZ, USA
Volume
29
Issue
5
fYear
2014
fDate
May-14
Firstpage
2220
Lastpage
2228
Abstract
A compact model for SiC Power MOSFETs is presented. The model features a physical description of the channel current and internal capacitances and has been validated for dc, CV, and switching characteristics with measured data from a 1200-V, 20-A SiC power MOSFET in a temperature range of 25°C to 225°C. The peculiar variation of on-state resistance with temperature for SiC power MOSFETs has also been demonstrated through measurements and accounted for in the developed model. In order to improve the user experience with the model, a new datasheet driven parameter extraction strategy has been presented which requires only data available in device datasheets, to enable quick parameter extraction for off-the-shelf devices. Excellent agreement is shown between measurement and simulation using the presented model over the entire temperature range.
Keywords
capacitance; power MOSFET; semiconductor device models; silicon compounds; switching; wide band gap semiconductors; CV characteristics; SiC; channel current; current 20 A; datasheet driven silicon carbide power MOSFET model; dc characteristics; internal capacitances; on-state resistance; switching characteristics; temperature 25 degC to 225 degC; voltage 1200 V; Capacitance; Logic gates; MOSFET; Mathematical model; Parameter extraction; Semiconductor device modeling; Silicon carbide; Device characterization; MOSFET; device modeling; device simulation; silicon carbide (SiC);
fLanguage
English
Journal_Title
Power Electronics, IEEE Transactions on
Publisher
ieee
ISSN
0885-8993
Type
jour
DOI
10.1109/TPEL.2013.2295774
Filename
6690196
Link To Document