DocumentCode :
35347
Title :
Datasheet Driven Silicon Carbide Power MOSFET Model
Author :
Mudholkar, Mihir ; Ahmed, Shehab ; Ericson, M. Nance ; Frank, S. Shane ; Britton, Charles L. ; Mantooth, Homer Alan
Author_Institution :
Stand. Products Group, ON Semicond., Phoenix, AZ, USA
Volume :
29
Issue :
5
fYear :
2014
fDate :
May-14
Firstpage :
2220
Lastpage :
2228
Abstract :
A compact model for SiC Power MOSFETs is presented. The model features a physical description of the channel current and internal capacitances and has been validated for dc, CV, and switching characteristics with measured data from a 1200-V, 20-A SiC power MOSFET in a temperature range of 25°C to 225°C. The peculiar variation of on-state resistance with temperature for SiC power MOSFETs has also been demonstrated through measurements and accounted for in the developed model. In order to improve the user experience with the model, a new datasheet driven parameter extraction strategy has been presented which requires only data available in device datasheets, to enable quick parameter extraction for off-the-shelf devices. Excellent agreement is shown between measurement and simulation using the presented model over the entire temperature range.
Keywords :
capacitance; power MOSFET; semiconductor device models; silicon compounds; switching; wide band gap semiconductors; CV characteristics; SiC; channel current; current 20 A; datasheet driven silicon carbide power MOSFET model; dc characteristics; internal capacitances; on-state resistance; switching characteristics; temperature 25 degC to 225 degC; voltage 1200 V; Capacitance; Logic gates; MOSFET; Mathematical model; Parameter extraction; Semiconductor device modeling; Silicon carbide; Device characterization; MOSFET; device modeling; device simulation; silicon carbide (SiC);
fLanguage :
English
Journal_Title :
Power Electronics, IEEE Transactions on
Publisher :
ieee
ISSN :
0885-8993
Type :
jour
DOI :
10.1109/TPEL.2013.2295774
Filename :
6690196
Link To Document :
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