• DocumentCode
    35347
  • Title

    Datasheet Driven Silicon Carbide Power MOSFET Model

  • Author

    Mudholkar, Mihir ; Ahmed, Shehab ; Ericson, M. Nance ; Frank, S. Shane ; Britton, Charles L. ; Mantooth, Homer Alan

  • Author_Institution
    Stand. Products Group, ON Semicond., Phoenix, AZ, USA
  • Volume
    29
  • Issue
    5
  • fYear
    2014
  • fDate
    May-14
  • Firstpage
    2220
  • Lastpage
    2228
  • Abstract
    A compact model for SiC Power MOSFETs is presented. The model features a physical description of the channel current and internal capacitances and has been validated for dc, CV, and switching characteristics with measured data from a 1200-V, 20-A SiC power MOSFET in a temperature range of 25°C to 225°C. The peculiar variation of on-state resistance with temperature for SiC power MOSFETs has also been demonstrated through measurements and accounted for in the developed model. In order to improve the user experience with the model, a new datasheet driven parameter extraction strategy has been presented which requires only data available in device datasheets, to enable quick parameter extraction for off-the-shelf devices. Excellent agreement is shown between measurement and simulation using the presented model over the entire temperature range.
  • Keywords
    capacitance; power MOSFET; semiconductor device models; silicon compounds; switching; wide band gap semiconductors; CV characteristics; SiC; channel current; current 20 A; datasheet driven silicon carbide power MOSFET model; dc characteristics; internal capacitances; on-state resistance; switching characteristics; temperature 25 degC to 225 degC; voltage 1200 V; Capacitance; Logic gates; MOSFET; Mathematical model; Parameter extraction; Semiconductor device modeling; Silicon carbide; Device characterization; MOSFET; device modeling; device simulation; silicon carbide (SiC);
  • fLanguage
    English
  • Journal_Title
    Power Electronics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0885-8993
  • Type

    jour

  • DOI
    10.1109/TPEL.2013.2295774
  • Filename
    6690196