Title :
A novel states recovery technique for the TMR softcore processor
Author :
Tanoue, Shiro ; Ishida, Tomoyuki ; Ichinomiya, Yoshihiro ; Amagasaki, Motoki ; Kuga, Morihiro ; Sueyoshi, Toshinori
Author_Institution :
Grad. Sch. of Sci. & Technol., Kumamoto Univ., Kumamoto, Japan
fDate :
Aug. 31 2009-Sept. 2 2009
Abstract :
The present paper describes a technique for ensuring re- liable softcore processor implementation on SRAM-based field programmable gate arrays (FPGAs), which can handle the effects of single event upsets (SEUs). We propose the triple modular redundancy (TMR) scheme coupled with dynamic partial reconfiguration to remove SEUs from the configuration memory of the FPGA. Although the FPGA is subject to SEUs, these errors can be corrected as a result of its reconfigurability. Furthermore, we consider the synchronization after a partial reconfiguration using an interrupt process of an RTOS. Experimental results reveal that one faulty softcore processor is recovered and synchronized with the other softcore processors. The present study demonstrates that a softcore processor can recover from an SEU using the proposed dynamic partial reconfiguration and the synchronization process.
Keywords :
SRAM chips; field programmable gate arrays; microprocessor chips; FPGA; SRAM-based field programmable gate arrays; Single Event Upsets; Triple Modular Redundancy; configuration memory; dynamic partial reconfiguration; field programmable gate arrays; softcore processor; states recovery technique; synchronization process; Circuit faults; Electrical fault detection; Error correction; Error correction codes; Field programmable gate arrays; Process design; Random access memory; Redundancy; Single event transient; Single event upset;
Conference_Titel :
Field Programmable Logic and Applications, 2009. FPL 2009. International Conference on
Conference_Location :
Prague
Print_ISBN :
978-1-4244-3892-1
Electronic_ISBN :
1946-1488
DOI :
10.1109/FPL.2009.5272423