DocumentCode
3534822
Title
A novel states recovery technique for the TMR softcore processor
Author
Tanoue, Shiro ; Ishida, Tomoyuki ; Ichinomiya, Yoshihiro ; Amagasaki, Motoki ; Kuga, Morihiro ; Sueyoshi, Toshinori
Author_Institution
Grad. Sch. of Sci. & Technol., Kumamoto Univ., Kumamoto, Japan
fYear
2009
fDate
Aug. 31 2009-Sept. 2 2009
Firstpage
543
Lastpage
546
Abstract
The present paper describes a technique for ensuring re- liable softcore processor implementation on SRAM-based field programmable gate arrays (FPGAs), which can handle the effects of single event upsets (SEUs). We propose the triple modular redundancy (TMR) scheme coupled with dynamic partial reconfiguration to remove SEUs from the configuration memory of the FPGA. Although the FPGA is subject to SEUs, these errors can be corrected as a result of its reconfigurability. Furthermore, we consider the synchronization after a partial reconfiguration using an interrupt process of an RTOS. Experimental results reveal that one faulty softcore processor is recovered and synchronized with the other softcore processors. The present study demonstrates that a softcore processor can recover from an SEU using the proposed dynamic partial reconfiguration and the synchronization process.
Keywords
SRAM chips; field programmable gate arrays; microprocessor chips; FPGA; SRAM-based field programmable gate arrays; Single Event Upsets; Triple Modular Redundancy; configuration memory; dynamic partial reconfiguration; field programmable gate arrays; softcore processor; states recovery technique; synchronization process; Circuit faults; Electrical fault detection; Error correction; Error correction codes; Field programmable gate arrays; Process design; Random access memory; Redundancy; Single event transient; Single event upset;
fLanguage
English
Publisher
ieee
Conference_Titel
Field Programmable Logic and Applications, 2009. FPL 2009. International Conference on
Conference_Location
Prague
ISSN
1946-1488
Print_ISBN
978-1-4244-3892-1
Electronic_ISBN
1946-1488
Type
conf
DOI
10.1109/FPL.2009.5272423
Filename
5272423
Link To Document