Title :
Study on novel high performance polymer nanocomposites for electronics packaging paper
Author :
Goyal, R.K. ; Rokade, K.A. ; Kapadia, A.S.
Author_Institution :
Dept. of Metall. & Mater. Sci., Coll. of Eng., Pune, Pune, India
Abstract :
This study deals with preparation and characterization of novel nanocomposites based on poly(etheretherketone) (PEEK) as matrix and nano-silica (SiO2) as filler. The content of SiO2 was varied between 0 and 30 wt. % (20 vol. %). The density, morphology, mechanical and dielectric properties of PEEK/SiO2 nanocomposites were investigated for use in electronic packaging. The density of the nanocomposites increased with the increasing content of SiO2 in the PEEK. Scanning electron microscope showed uniform dispersion of nano-SiO2 in the PEEK at lower SiO2 content. However at higher SiO2 content, severe aggregates were found. The 30 wt. % SiO2 nanocomposite showed 54% increase in Vickers microhardness. A modified rule of mixtures with β = 0.10 fits the data nicely. The dielectric constant and the loss factor are within the range of requirements for commercial use.
Keywords :
Vickers hardness; aggregation; density; dielectric losses; disperse systems; electronics packaging; filled polymers; microhardness; nanocomposites; nanofabrication; permittivity; scanning electron microscopy; silicon compounds; SiO2; Vickers microhardness; aggregation; dielectric constant; dielectric loss factor; dielectric properties; electronic packaging; mechanical properties; nanocomposite density; nanocomposite morphology; nanosilica dispersion; nanosilica filler; poly(etheretherketone); polymer nanocomposites; scanning electron microscopy; Boron; Dielectrics; Films; Glass; Dielectric constant; Dissipation factor; Microhardness; Nanocomposites; PEEK; SEM; SiO2;
Conference_Titel :
Nanoscience, Engineering and Technology (ICONSET), 2011 International Conference on
Conference_Location :
Chennai
Print_ISBN :
978-1-4673-0071-1
DOI :
10.1109/ICONSET.2011.6167985