DocumentCode :
3535093
Title :
Spectroscopic analysis of tracked silicone rubber insulation
Author :
Ganga, S. ; Vasudev, N. ; Thambi, V. Asai ; Vainatheya ; Viswanath, G.R. ; Aradhya, R. S Shivakumara
Author_Institution :
Central Power Res. Inst., Bangalore, India
fYear :
2012
fDate :
24-28 July 2012
Firstpage :
1
Lastpage :
4
Abstract :
In the present study FTIR, SEM and EDAX analysis are carried out for better understanding of morphology of samples with two different silicone rubber formulations subjected to inclined plane tracking test for both with and without UV radiations of different intensities. The morphological behavior of the material is also given for polluted samples after they have undergone inclined plane tracking test with UV super imposed. The surface composition of Silicone rubber from EDAX analysis indicated no significant change in elemental levels of Silicone(Si), carbon(C) and oxygen(O) prior to UV exposure. However the reduction in the element Aluminium(Al), is significant in specimens subjected to test as per IEC 60587, in the presence of UV radiations and also for samples after 1000 hours UV exposure. It is also inferred from the study that, the intensity of UV radiation during inclined plane tracking test and long duration UV exposure in weather o meter plays a major role in deteriorating the surface characteristics of the material.
Keywords :
X-ray chemical analysis; scanning electron microscopy; silicone rubber insulators; EDAX analysis; FTIR analysis; IEC 60587; SEM analysis; UV radiations; inclined plane tracking test; morphological behavior; spectroscopic analysis; surface characteristics; surface composition; tracked silicone rubber insulation; Artificial intelligence; Silicon; Silicone rubber; UV; surface morphology; tracking and erosion test;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Properties and Applications of Dielectric Materials (ICPADM), 2012 IEEE 10th International Conference on the
Conference_Location :
Bangalore
ISSN :
2160-9225
Print_ISBN :
978-1-4673-2852-4
Type :
conf
DOI :
10.1109/ICPADM.2012.6318905
Filename :
6318905
Link To Document :
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