• DocumentCode
    3535443
  • Title

    Internal charging in low density polyethylene irradiated by energetic electrons

  • Author

    Zhao, Ni ; Min, Daomin ; Li, Shengtao ; Zheng, Xiaoquan

  • Author_Institution
    State Key Lab. of Electr. Insulation & Power Equip., Xi´´an Jiaotong Univ., Xi´´an, China
  • fYear
    2012
  • fDate
    24-28 July 2012
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    Basing on the range theory of European Space Agency (ESA) and Touzin´s charge deposition theories, a 1-D internal charging model has been employed in simulating the effects of incident electron flux (IEF) and irradiation time on deep dielectric charging (DDC). It is calculated that the distribution of electric field, conductivity and space charge under both different IEF and time. The results indicate there is an IEF threshold, about 2.0×1012/m2s, on which conductivity mechanism changes and the development velocity of electric field distortion decreases. Moreover, thermal assisted hopping conductivity (TAH) is the vital influence factor of the internal charging/discharging. The results are useful for understanding the mechanism of charge transport and internal charging/discharging phenomenon.
  • Keywords
    polyethylene insulation; thermal conductivity; DOC; ESA; European Space Agency; IEF; LDPE; TAH; Touzin charge deposition theory; charge transport mechanism; deep dielectric charging; development velocity; electric field distortion; electric field distribution; energetic electrons; incident electron flux; internal charging-discharging model; low density polyethylene irradiation; thermal assisted hopping conductivity; Analytical models; Radio access networks; Surface charging; Conductivity; Internal charging; LDPE; Space charge;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Properties and Applications of Dielectric Materials (ICPADM), 2012 IEEE 10th International Conference on the
  • Conference_Location
    Bangalore
  • ISSN
    2160-9225
  • Print_ISBN
    978-1-4673-2852-4
  • Type

    conf

  • DOI
    10.1109/ICPADM.2012.6318936
  • Filename
    6318936