• DocumentCode
    3535662
  • Title

    Comparison of thermal response of GMR sensor subjected to HBM and CDM transients

  • Author

    Yang, Yizhang ; Asheghi, Mehdi

  • Author_Institution
    Dept. Of Mech. Eng., Carnegie Mellon Univ., Pittsburgh, PA, USA
  • fYear
    2004
  • fDate
    19-23 Sept. 2004
  • Firstpage
    1
  • Lastpage
    5
  • Abstract
    The thermal response of the GMR sensor during the ESD pulse is investigated using finite element model. The simulation compares the transient temperature rise in GMR sensor when they are subjected to the Human Body Model (HBM) and Charged-Device Model (CDM) waveforms. The results indicate that the ESD threshold damage for GMR head depends on both the thermal time constant and the ESD transient current.
  • Keywords
    electrostatic discharge; finite element analysis; giant magnetoresistance; heat transfer; magnetoresistive devices; CDM transient; ESD pulse; GMR sensor; HBM transient; charged-device model; finite element model; human body model; thermal response; Antiferromagnetic materials; Electrostatic discharge; Magnetic fields; Magnetic heads; Magnetic materials; Material storage; Robust stability; Robustness; Thermal sensors; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Overstress/Electrostatic Discharge Symposium, 2004. EOS/ESD '04.
  • Conference_Location
    Grapevine, TX
  • Print_ISBN
    978-1-5853-7063-4
  • Electronic_ISBN
    978-1-5853-7063-4
  • Type

    conf

  • DOI
    10.1109/EOSESD.2004.5272586
  • Filename
    5272586