Title :
ESD protection design using a mixed-mode simulation for advanced devices
Author :
Hayashi, Hirokazu ; Kuroda, Toshikazu ; Kato, Katsuhiro ; Fukuda, Koichi ; Baba, Shunsuke ; Fukuda, Yasuhiro
Author_Institution :
Oki Electr. Ind. Co. Ltd., Hachioji, Japan
Abstract :
In this paper, we propose a new ESD protection design methodology using a mixed-mode ESD simulation that takes account of a coupling effect for both device and circuit. As a result, we can analysis the each protection unit operation and select the optimized protection circuits in prevention of ESD failure on separated power supply units by prediction of the simulation.
Keywords :
electrostatic discharge; mixed analogue-digital integrated circuits; ESD protection design; advanced devices; mixed-mode simulation; power supply units; Breakdown voltage; Circuit simulation; Coupling circuits; Design methodology; Electrostatic discharge; Large scale integration; MOSFET circuits; Power supplies; Power system protection; Predictive models;
Conference_Titel :
Electrical Overstress/Electrostatic Discharge Symposium, 2004. EOS/ESD '04.
Conference_Location :
Grapevine, TX
Print_ISBN :
978-1-5853-7063-4
Electronic_ISBN :
978-1-5853-7063-4
DOI :
10.1109/EOSESD.2004.5272620
