Title :
Physicochemical properties investigation in nano sized SiO2 filled silicone rubber for high voltage insulation applications
Author :
Loganathan, N. ; Chandrasekar, S.
Author_Institution :
K.S.Rangasamy Coll. of Technol., Tiruchengode, India
Abstract :
This paper discusses the nano sized SiO2 filled virgin and aged silicon rubber (SIR) materials under AC Voltage with ammonium chloride as a contaminant as per IEC 60587 test Procedures in the view of understanding its tracking and erosion resistances. The characteristic variations in the tracking resistance of nano sized SiO2 filled virgin and aged SIR specimens are analysed and eroded masses are used to evaluate the relative erosion and tracking resistance of the composites. The Thermo Gravimetry-DerivativeThermoGravimetricTG-DTG) studies are performed to understand the thermal degradation of nano sized SiO2 filled SIR materials with different percentage weights (% wt) of filler. The obtained result shows that the thermal performance of nano filled virgin and aged SIR specimens are improved when the % wt of filler is increased. The Scanning Electron Microscope (SEM) with Energy Dispersive X-ray (EDAX) is used to examine the filler dispersion and surface morphology of the virgin and aged SIR.
Keywords :
IEC standards; X-ray chemical analysis; ammonium compounds; scanning electron microscopy; silicone rubber; surface morphology; thermal analysis; AC Voltage; EDAX; IEC 60587 test procedures; SEM; SiO2; TG-DTG study; aged silicon rubber; ammonium chloride; contaminant; energy dispersive X-ray; erosion resistances; filler dispersion; high-voltage insulation application; nanosized silicon dioxide-filled silicone rubber; physicochemical properties; relative erosion; scanning electron microscope; surface morphology; thermal degradation; thermal performance; thermo gravimetry-derivative thermogravimetric study; tracking resistance; virgin silicon rubber; Aging; Artificial intelligence; Insulation; Nitrogen; Resistance; Thermal degradation; Outdoor insulator; nano filler; silicone rubber; tracking resistance;
Conference_Titel :
Properties and Applications of Dielectric Materials (ICPADM), 2012 IEEE 10th International Conference on the
Conference_Location :
Bangalore
Print_ISBN :
978-1-4673-2852-4
DOI :
10.1109/ICPADM.2012.6318993