Title :
Investigations of the high flux behavior of CdTe-Medipix2 assemblies at the synchrotron ANKA
Author :
Greiffenberg, D. ; Cecilia, A. ; Zwerger, A. ; Fauler, A. ; Vagovic, P. ; Butzer, J. ; Hamann, E. ; Rolo, T. Dos Santos ; Baumbach, T. ; Fiederle, M.
Author_Institution :
Freiburger Materialforschungszentrum (FMF), Univ. of Freiburg, Freiburg, Germany
fDate :
Oct. 30 2010-Nov. 6 2010
Abstract :
CdTe is a promising sensor material for the detection of γ-Rays and X-Rays as it offers an absorption efficiency higher than 50 % for photon energies up to 120 keV for 1 mm thick sensors. Connected to the pixilated, single-photon counting readout electronics Timepix, its application at a synchrotron source was investigated. The focus of the investigations was on the high flux behavior of the CdTe-Timepix assemblies, as CdTe is known to suffer from a degradation of the count-rates when being illuminated with high photon fluxes. Moreover, the high flux behavior of the readout electronics itself was investigated by measuring an assembly with a silicon sensor, which is not known to suffer from a degradation effect at high photon fluxes.
Keywords :
II-VI semiconductors; X-ray apparatus; X-ray effects; cadmium compounds; gamma-ray apparatus; gamma-ray effects; nuclear electronics; readout electronics; semiconductor counters; synchrotron radiation; ANKA synchrotron; CdTe; CdTe sensor material; CdTe-Medipix2 assemblies; CdTe-Timepix assemblies; X-ray detection; count rate degradation; gamma-ray detection; high flux behavior; pixilated single photon counting readout electronics; synchrotron source; Assembly; Degradation; Lighting; Materials; Photonics; Pixel; Synchrotrons;
Conference_Titel :
Nuclear Science Symposium Conference Record (NSS/MIC), 2010 IEEE
Conference_Location :
Knoxville, TN
Print_ISBN :
978-1-4244-9106-3
DOI :
10.1109/NSSMIC.2010.5874501
