Title :
Soft ESD phenomena in GMR heads in the HDD manufacturing process
Author :
Mizoh, Yoshiaki ; Nakano, Taro ; Tagashira, Kozo ; Nakamura, Kazuo ; Suzuki, Tatsuya
Author_Institution :
Matsushita-Kotobuki Electron. Ind., Ltd., Saijo, Japan
Abstract :
GMR heads used for hard disk drives (HDD) are very sensitive to ESD. A kind of ESD damage makes a soft magnetic degradation of head performance with time. We report examples of head degradation modes by ESD damage and other damage modes as head Scratch damage, electro migration effects and corrosion of GMR stack, which are usually difficult to be distinguished explicitly by QST and Spinstand measurement test.
Keywords :
disc drives; electromigration; electrostatic discharge; giant magnetoresistance; hard discs; magnetic heads; QST measurement test; Spinstand measurement test; electromigration; electrostatic discharge; giant magnetoresistance heads; hard disk drives; head scratch damage; soft magnetic degradation; 1f noise; Degradation; Distortion; Electrostatic discharge; Magnetic heads; Magnetic noise; Manufacturing processes; Noise figure; Noise level; Soft magnetic materials;
Conference_Titel :
Electrical Overstress/Electrostatic Discharge Symposium, 2004. EOS/ESD '04.
Conference_Location :
Grapevine, TX
Print_ISBN :
978-1-5853-7063-4
Electronic_ISBN :
978-1-5853-7063-4
DOI :
10.1109/EOSESD.2004.5272644