Title :
Dielectric properties of CaCu3Ti4O12 thick films
Author :
Wang, Hui ; Li, Shengtao ; Lin, Chunjiang ; Li, Jianying ; Rong, Mingzhe
Author_Institution :
State Key Lab. of Electr. Insulation & Power Equip., Xi´´an Jiaotong Univ., Xi´´an, China
Abstract :
CaCu3Ti4O12 is believed to have a variety of potential applications due to its unusual high dielectric constant and very high thermal stability. Ceramic films of CaCu3Ti4O12 differ from bulk specimens in dielectric and other physical properties. In this paper, the dielectric properties of CCTO thick films are investigated by SEM and dielectric spectra analysis. The difference thicknesses (0.1 mm, 0.2 mm, 0.3 mm) of thick films formed by the rolling-film method, and the permittivity of the thick film is almost the same value as the same-based CCTO bulk. It is found that the orientation of grain grown, the average particle size and thickness can significantly influence the dielectric properties of CCTO thick films.
Keywords :
calcium compounds; ceramics; copper compounds; grain growth; particle size; permittivity; rolling; scanning electron microscopy; thermal stability; thick films; titanium compounds; CaCu3Ti4O12; SEM; average particle size; ceramic films; dielectric properties; dielectric spectra analysis; grain growth orientation; high dielectric constant; rolling-film method; size 0.1 mm; size 0.2 mm; size 0.3 mm; thermal stability; Dielectrics; Epitaxial growth; Heating; Microscopy; Optical films; CaCu3Ti4O12 ceramics; dielectric properties; giant permittivity; thick film;
Conference_Titel :
Properties and Applications of Dielectric Materials (ICPADM), 2012 IEEE 10th International Conference on the
Conference_Location :
Bangalore
Print_ISBN :
978-1-4673-2852-4
DOI :
10.1109/ICPADM.2012.6319018
