Title :
Investigating the small pixel effect in CdZnTe Hard X-ray detectors — The PIXIE ASIC
Author :
Veale, Matthew C. ; Bell, Steven J. ; Jones, Lawrence L. ; Seller, Paul ; Wilson, Matthew D. ; Allwork, Christopher ; Kitou, Dimitris ; Sellin, Paul J. ; Veeramani, Perumal ; Cernik, Robert C.
Author_Institution :
Rutherford Appleton Lab., Sci. & Technol. Facilities Council, Didcot, UK
fDate :
Oct. 30 2010-Nov. 6 2010
Abstract :
An Application Specific Integrated Circuit (ASIC) has been developed at the Rutherford Appleton Laboratory (RAL) to study the small pixel effect in spectroscopic CdTe and CdZnTe detectors. The PIXIE ASIC consists of four arrays of 3×3 channels flip chip bonded directly to the detector pixels. The active circuitry of each channel is a charge sensitive preamplifier and an output buffer which is multiplexed directly off chip. Each of the four arrays has different anode geometry. The HEXITEC series of small pixel detectors developed at RAL have demonstrated energy resolutions of ~1keV per pixel for both CdTe and CdZnTe, however, charge sharing events account for between 30-40% of the total count rate and can lead to degradation of the spectroscopy if not corrected for. The PIXIE ASIC will be used to study the effect of anode geometry on charge sharing and other aspects of the small pixel effect.
Keywords :
II-VI semiconductors; X-ray spectrometers; X-ray spectroscopy; anodes; application specific integrated circuits; buffer circuits; cadmium compounds; preamplifiers; readout electronics; semiconductor counters; CdTe; CdZnTe; CdZnTe hard X-ray detectors; HEXITEC series; PIXIE ASIC; RAL; Rutherford Appleton Laboratory; active circuitry; anode geometry; application specific integrated circuit; charge sensitive preamplifier; charge sharing events; detector pixels; flip chip bonding; output buffer; small pixel effect; spectroscopic CdTe detectors; spectroscopic CdZnTe detectors; Anodes; Application specific integrated circuits; Detectors; Geometry; Laboratories; Pixel; Spectroscopy;
Conference_Titel :
Nuclear Science Symposium Conference Record (NSS/MIC), 2010 IEEE
Conference_Location :
Knoxville, TN
Print_ISBN :
978-1-4244-9106-3
DOI :
10.1109/NSSMIC.2010.5874521