DocumentCode
3536423
Title
Correlative-impulse measuring instrument of low frequency noise sources of semiconductor devises
Author
Malyshev, V.M.
Author_Institution
St.-Petersburg State Polytech. Univ., St.-Petersburg, Russia
fYear
2012
fDate
19-20 Sept. 2012
Firstpage
26
Lastpage
32
Abstract
The skeleton diagram of correlative-impulse measuring instrument of LF noise sources of semiconductor devises is shown. The principle of action of a measuring instrument for a case of measurements of diodes with Schottky barrier is considered. The reasons of inaccuracy of measurements are specified. The assessment of accuracy of correlation coefficient is given.
Keywords
Schottky barriers; Schottky diodes; impulse noise; noise measurement; semiconductor device measurement; semiconductor device noise; LF noise sources; correlation coefficient accuracy assessment; correlative-impulse measuring instrument; diode measurements; low frequency noise sources; semiconductor devices; skeleton diagram; Frequency measurement; Noise; Noise measurement; Semiconductor device measurement;
fLanguage
English
Publisher
ieee
Conference_Titel
Actual Problems of Electron Devices Engineering (APEDE), 2012 International Conference on
Conference_Location
Saratov
Print_ISBN
978-1-4673-2096-2
Type
conf
DOI
10.1109/APEDE.2012.6478007
Filename
6478007
Link To Document