• DocumentCode
    3536471
  • Title

    Energy selective X-ray imaging with Medipix

  • Author

    Procz, S. ; Lübke, J. ; Zwerger, A. ; Fauler, A. ; Pichotka, M. ; Mix, M. ; Fiederle, M.

  • Author_Institution
    Freiburger Materialforschungszentrum (FMF), Freiburg, Germany
  • fYear
    2010
  • fDate
    Oct. 30 2010-Nov. 6 2010
  • Firstpage
    3846
  • Lastpage
    3851
  • Abstract
    Pixelated photon counting semiconductor X-ray detectors like the Medipix feature adjustable energy thresholds allowing selective counting of photons of a specified energy. This enables energy selective X-ray imaging with advanced material information. Furthermore the photon counting function principle of these detectors enables almost noiseless X-ray imaging providing a high contrast in low contrast objects. The aim of this study is to analyze the stability of the new Medipix3 detector especially in relation to flatfield correction for X-ray imaging applications and to present its use for high resolution low contrast X-ray imaging, and for energy selective X-ray imaging as well.
  • Keywords
    diagnostic radiography; photon counting; photons; Medipix3 detector; advanced material information; energy selective X-ray imaging; energy thresholds; flatfield correction; high resolution low contrast X-ray imaging; low contrast objects; noiseless X-ray imaging; pixelated photon counting semiconductor X-ray detectors; Detectors; Photonics; Pixel; Semiconductor device measurement; Signal to noise ratio; Time measurement; X-ray imaging;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nuclear Science Symposium Conference Record (NSS/MIC), 2010 IEEE
  • Conference_Location
    Knoxville, TN
  • ISSN
    1095-7863
  • Print_ISBN
    978-1-4244-9106-3
  • Type

    conf

  • DOI
    10.1109/NSSMIC.2010.5874533
  • Filename
    5874533