• DocumentCode
    3536487
  • Title

    Simulation of LF noises FET in the program «Micro-Cap» in THE «Transient analysis» mode

  • Author

    Malyshev, V.M.

  • Author_Institution
    St.-Petersburg State Polytech. Univ., St.-Petersburg, Russia
  • fYear
    2012
  • fDate
    19-20 Sept. 2012
  • Firstpage
    46
  • Lastpage
    50
  • Abstract
    The model of the modulation LF noise source which allows to simulate noise in the "Micro-Cap" program in the "Transient analysis" mode is given. Results of simulation of the flicker noise of FET are shown, when using this noise source.
  • Keywords
    electronic engineering computing; field effect transistors; flicker noise; transient analysis; FET; MicroCap program; flicker noise simulation; modulation LF noise source; transient analysis mode;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Actual Problems of Electron Devices Engineering (APEDE), 2012 International Conference on
  • Conference_Location
    Saratov
  • Print_ISBN
    978-1-4673-2096-2
  • Type

    conf

  • DOI
    10.1109/APEDE.2012.6478011
  • Filename
    6478011
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3536487