• DocumentCode
    3536517
  • Title

    Coincidence measurement of 350μm pitch pixelated CdZnTe detector with LSO PET module

  • Author

    Yin, Yongzhi ; Wu, Heyu ; Komarov, Sergey ; Garson, Alfred, III ; Guo, Qingzhen ; Krawczynski, Henric ; Meng, Ling-Jian ; Tai, Yuan-Chuan

  • Author_Institution
    Sch. of Med., Dept. of Radiol., Washington Univ., St. Louis, MO, USA
  • fYear
    2010
  • fDate
    Oct. 30 2010-Nov. 6 2010
  • Firstpage
    3868
  • Lastpage
    3872
  • Abstract
    A coincidence detection system between 350μm pitch pixelated CZT detector and a LSO-based Inveon PET detector was built up for PET imaging application. Using different trigger mode, we studied how the triggering strategy affects the PET imaging resolution. We obtained 670μm at FWHM image resolution for coincidence events detected by CZT central pixel only. If we include coincidence events from CZT double-pixel charge sharing events (while the CZT central pixel still got the biggest signal amplitude), the PET image resolution degrades to 730μm FWHM, but the count rate increases 2.5 to 3 times. We estimated the CZT timing property in different coincidence approaches, i.e. triggered by CZT anode signal or LSO signal, based on the electron drift time measurement from one flash ADC system and the measurement of trigger time difference of LSO and CZT signals.
  • Keywords
    analogue-digital conversion; coincidence techniques; image resolution; nuclear electronics; positron emission tomography; semiconductor counters; trigger circuits; CZT anode signal; CZT central pixel; CZT double-pixel charge sharing events; CZT timing property; FWHM image resolution; LSO PET module; LSO signal; LSO-based Inveon PET detector; PET imaging application; PET imaging resolution; coincidence detection system; coincidence events; count rate; electron drift time measurement; flash ADC system; pixelated CZT detector; signal amplitude; trigger mode; trigger time difference; triggering strategy; Anodes; Cathodes; Detectors; Image resolution; Pixel; Positron emission tomography; Timing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nuclear Science Symposium Conference Record (NSS/MIC), 2010 IEEE
  • Conference_Location
    Knoxville, TN
  • ISSN
    1095-7863
  • Print_ISBN
    978-1-4244-9106-3
  • Type

    conf

  • DOI
    10.1109/NSSMIC.2010.5874538
  • Filename
    5874538