Title :
Energy dispersive X-ray diffraction spectral resolution considerations for security screening applications
Author :
Cozzini, C. ; Harding, G. ; Edic, P. ; Beque, D. ; Kosciesza, D. ; Du, Y. ; Strecker, H.
Author_Institution :
GE Global Res., Garching, Germany
fDate :
Oct. 30 2010-Nov. 6 2010
Abstract :
Energy dispersive X-ray diffraction (EDXRD) is a very effective method for explosive and narcotic threat detection in baggage screening. The XRD profiles arise from the molecular interference when X-rays are coherently scattered by a substance. The accurate identification of the target material depends on the ability to detect and resolve the peaks present in the coherent scatter profiles. A high-energy resolution High Purity Germanium (HPGe) detector is therefore generally used in such type of systems. To evaluate the suitability of cost-effective room-temperature semiconductor detectors for next-generation baggage screening systems, an assessment of the minimal requirements for the system resolution is required. In this study a hybrid Monte Carlo code has been modified to account for the molecular interference function that gives rise to the coherent scatter signature. A model for a realistic response function for Cadmium Zinc Telluride (CZT) detectors is then used to convolve the spectral output. This simulation tool is then used to assess the system design features and their influence on spectral resolution.
Keywords :
Monte Carlo methods; X-ray diffraction; explosives; germanium radiation detectors; high energy physics instrumentation computing; shielding; Cadmium Zinc Telluride detectors; XRD profiles; baggage screening; cost-effective room-temperature semiconductor detectors; energy dispersive X-ray diffraction; high purity germanium detector; hybrid Monte Carlo code; molecular interference function; narcotic threat detection; security screening applications; Detectors; Energy resolution; Interference; Pixel; Scattering; X-ray diffraction; X-ray scattering;
Conference_Titel :
Nuclear Science Symposium Conference Record (NSS/MIC), 2010 IEEE
Conference_Location :
Knoxville, TN
Print_ISBN :
978-1-4244-9106-3
DOI :
10.1109/NSSMIC.2010.5874539