DocumentCode :
3536669
Title :
VLSI architecture for the embedded extraction of dominant points on object contours
Author :
Dallaire, Stephane ; Tremblay, Marc ; Poussart, Denis
Author_Institution :
Comput. Vision & Syst. Lab., Laval Univ., Que., Canada
fYear :
1997
fDate :
20-22 Oct 1997
Firstpage :
96
Lastpage :
105
Abstract :
This paper presents a special-purpose VLSI architecture for dominant point extraction along 2D contours. Such dominant points carry useful information for shape analysis and pattern recognition applications since they represent a local shape property and segment object contours into piecewise linear segments and circular arcs. The proposed architecture implements an algorithm based on the curvature primal sketch. It consists of a set of 1D systolic FIR filters performing a multiresolution analysis of the scene´s object contours, a set of finite-state-machines extracting zero-crossings and extrema of the filtered data, and a set of scale-space integration cells combining the accurate locations provided by the finest filters with the noise rejection properties of the coarsest ones in order to reliably extract relevant dominant points with accurate localization. The overall architecture has been successfully implemented and integrated to a custom machine vision system with real-time edge-extraction and edge-tracking capabilities. Some experimental results obtained using this system are presented and discussed. Performance issues are also addressed
Keywords :
FIR filters; VLSI; computer vision; feature extraction; finite state machines; object detection; real-time systems; 1D systolic FIR filters; 2D contours; VLSI architecture; dominant points; edge-tracking; embedded extraction; finite-state-machines; local shape property; machine vision system; multiresolution analysis; object contours; pattern recognition; piecewise linear segments; real-time edge-extraction; scale-space integration cells; shape analysis; zero-crossings; Data mining; Finite impulse response filter; Information analysis; Machine vision; Multiresolution analysis; Pattern analysis; Pattern recognition; Piecewise linear techniques; Shape; Very large scale integration;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Computer Architecture for Machine Perception, 1997. CAMP 97. Proceedings. 1997 Fourth IEEE International Workshop on
Conference_Location :
Cambridge, MA
Print_ISBN :
0-8186-7987-5
Type :
conf
DOI :
10.1109/CAMP.1997.631905
Filename :
631905
Link To Document :
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