DocumentCode :
3536721
Title :
Analysis of multilayered periodic structures with anisotropic media
Author :
Takahashi, Kazuhiro ; Kitazawa, Toshihide
Author_Institution :
Dept. of Electr. & Electron. Eng., Ibaraki Univ., Hitachi, Japan
Volume :
2
fYear :
1993
fDate :
1993
Firstpage :
15250
Abstract :
An analytical method is presented for the plane wave scattering by periodic structures by using the extended spectral domain approach (ESDA). The effect of the finite metallization thickness of the periodic gratings can be taken into consideration, and the structures with multilayered anisotropic media can be treated easily. Accuracy and efficiency of the method is demonstrated by numerical computations
Keywords :
electromagnetic wave scattering; spectral-domain analysis; analytical method; anisotropic media; extended spectral domain approach; finite metallization thickness; multilayered anisotropic media; multilayered periodic structures; periodic gratings; plane wave scattering; Anisotropic magnetoresistance; Apertures; Conductors; Dielectric substrates; Electromagnetic fields; Frequency selective surfaces; Gratings; Metallization; Periodic structures; Scattering; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microwave Conference Proceedings, 1993. APMC '93., 1993 Asia-Pacific
Conference_Location :
Hsinchu
Print_ISBN :
0-7803-1352-6
Type :
conf
DOI :
10.1109/APMC.1993.468655
Filename :
468655
Link To Document :
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