• DocumentCode
    3536793
  • Title

    Effect of interface roughness on exchange coupling in synthetic antiferromagnetic multilayers

  • Author

    Desai, M. ; Misra, A. ; Doyle, W.D.

  • Author_Institution
    Dept. of Phys., Alabama Univ., Tuscaloosa, AL, USA
  • fYear
    2005
  • fDate
    4-8 April 2005
  • Firstpage
    1323
  • Lastpage
    1324
  • Abstract
    In this work, FeCo/Ru/FeCo synthetic antiferromagnetic multilayers were deposited at ambient temperature on glass substrates under two different dc magnetron sputtering conditions which significantly changed the interface roughness. Interface roughness was calculated from X-ray reflectivity measurements. Angular dependent torque curves and hysteresis loops were calculated from energy minimization for a simple domain model assuming both bilinear and biquadratic exchange and were fitted to the experimental data. The effect on the reversal process and in particular, on the apparent exchange couplings, was found to be significant.
  • Keywords
    X-ray reflection; antiferromagnetic materials; cobalt alloys; exchange interactions (electron); interface roughness; iron alloys; magnetic hysteresis; magnetic multilayers; magnetisation reversal; ruthenium; sputtered coatings; torque; FeCo-Ru-FeCo; SiO2; X-ray reflectivity; angular dependent torque curves; bilinear exchange; biquadratic exchange; dc magnetron sputtering; domain model; energy minimization; exchange coupling; glass substrates; hysteresis loops; interface roughness; synthetic antiferromagnetic multilayers; Antiferromagnetic materials; Glass; Hysteresis; Magnetic domains; Magnetic multilayers; Nonhomogeneous media; Reflectivity; Sputtering; Temperature; Torque;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Magnetics Conference, 2005. INTERMAG Asia 2005. Digests of the IEEE International
  • Print_ISBN
    0-7803-9009-1
  • Type

    conf

  • DOI
    10.1109/INTMAG.2005.1464091
  • Filename
    1464091