• DocumentCode
    3536831
  • Title

    Hardware reduction in concurrent error detection checkers in linear analog circuits using continuous checksums

  • Author

    Wong, Mike W T ; Zhou, Yingquan ; Min, Yinghua

  • Author_Institution
    Dept. of Electron. Eng., Hong Kong Polytech. Univ., Kowloon, Hong Kong
  • fYear
    1995
  • fDate
    6-10 Nov 1995
  • Firstpage
    359
  • Lastpage
    362
  • Abstract
    An algorithm proposed by Yingquan Zhou et al. (1995) for effectively reducing hardware overhead of the checking circuitry in the continuous checksums based concurrent error detection (CED) scheme in linear analog circuits is discussed. Without changing the original circuit, the algorithm generates such an appropriate coding matrix that makes the resulting checking circuitry have optimal hardware overhead
  • Keywords
    analogue integrated circuits; automatic test software; error detection; integrated circuit testing; checking circuitry hardware overhead; coding matrix; concurrent error detection checkers; continuous checksums; hardware reduction; linear analog circuits; Analog circuits; Analog computers; Automatic testing; Circuit testing; Ear; Equations; Fault tolerance; Hardware; Laboratories; Vectors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microelectronics and VLSI, 1995. TENCON '95., IEEE Region 10 International Conference on
  • Print_ISBN
    0-7803-2624-5
  • Type

    conf

  • DOI
    10.1109/TENCON.1995.496414
  • Filename
    496414