DocumentCode
3536831
Title
Hardware reduction in concurrent error detection checkers in linear analog circuits using continuous checksums
Author
Wong, Mike W T ; Zhou, Yingquan ; Min, Yinghua
Author_Institution
Dept. of Electron. Eng., Hong Kong Polytech. Univ., Kowloon, Hong Kong
fYear
1995
fDate
6-10 Nov 1995
Firstpage
359
Lastpage
362
Abstract
An algorithm proposed by Yingquan Zhou et al. (1995) for effectively reducing hardware overhead of the checking circuitry in the continuous checksums based concurrent error detection (CED) scheme in linear analog circuits is discussed. Without changing the original circuit, the algorithm generates such an appropriate coding matrix that makes the resulting checking circuitry have optimal hardware overhead
Keywords
analogue integrated circuits; automatic test software; error detection; integrated circuit testing; checking circuitry hardware overhead; coding matrix; concurrent error detection checkers; continuous checksums; hardware reduction; linear analog circuits; Analog circuits; Analog computers; Automatic testing; Circuit testing; Ear; Equations; Fault tolerance; Hardware; Laboratories; Vectors;
fLanguage
English
Publisher
ieee
Conference_Titel
Microelectronics and VLSI, 1995. TENCON '95., IEEE Region 10 International Conference on
Print_ISBN
0-7803-2624-5
Type
conf
DOI
10.1109/TENCON.1995.496414
Filename
496414
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