Title :
Hardware reduction in concurrent error detection checkers in linear analog circuits using continuous checksums
Author :
Wong, Mike W T ; Zhou, Yingquan ; Min, Yinghua
Author_Institution :
Dept. of Electron. Eng., Hong Kong Polytech. Univ., Kowloon, Hong Kong
Abstract :
An algorithm proposed by Yingquan Zhou et al. (1995) for effectively reducing hardware overhead of the checking circuitry in the continuous checksums based concurrent error detection (CED) scheme in linear analog circuits is discussed. Without changing the original circuit, the algorithm generates such an appropriate coding matrix that makes the resulting checking circuitry have optimal hardware overhead
Keywords :
analogue integrated circuits; automatic test software; error detection; integrated circuit testing; checking circuitry hardware overhead; coding matrix; concurrent error detection checkers; continuous checksums; hardware reduction; linear analog circuits; Analog circuits; Analog computers; Automatic testing; Circuit testing; Ear; Equations; Fault tolerance; Hardware; Laboratories; Vectors;
Conference_Titel :
Microelectronics and VLSI, 1995. TENCON '95., IEEE Region 10 International Conference on
Print_ISBN :
0-7803-2624-5
DOI :
10.1109/TENCON.1995.496414