Title :
Cross-talk prevention for power integrated circuits
Author :
Chan, Wilson W T ; Wong, Felix C Y ; Sin, Johnny K O ; Wong, S. Simon
Author_Institution :
Dept. of Electr. & Electron. Eng., Hong Kong Univ. of Sci. & Technol., Clear Water Bay, Hong Kong
Abstract :
Power Integrated Circuit (PIC), which combines one or more power devices with CMOS logic and control circuit on the same chip, offer simplified design, reduced system costs, and increased reliability. One of the main challenges of this technology is cross-talk prevention between the power device and CMOS circuit or between one power device to another power device. This paper presents an innovative isolation structure which can be used to prevent cross-talk in PICs. Two dimensional device simulation using MEDICI was carried out to characterize the performance of this structure with different configurations and dimensions. Results show that the structure is effective in preventing latch-up and cross-talk in CMOS structures caused by minority current flow in the substrate
Keywords :
CMOS integrated circuits; MOS integrated circuits; crosstalk; integrated circuit modelling; integrated circuit technology; isolation technology; power integrated circuits; CMOS logic; DMOS power devices; MEDICI; crosstalk prevention; isolation structure; latchup prevention; minority current flow; power integrated circuits; two dimensional device simulation; CMOS logic circuits; CMOS technology; Control systems; Costs; Integrated circuit reliability; Integrated circuit technology; Logic design; Logic devices; Power integrated circuits; Power system reliability;
Conference_Titel :
Microelectronics and VLSI, 1995. TENCON '95., IEEE Region 10 International Conference on
Print_ISBN :
0-7803-2624-5
DOI :
10.1109/TENCON.1995.496431
