Title :
Automated system for the measurement of thermal impedance components of semiconductor devices
Author :
Korunov, D.I. ; Smirnov, V.I.
Author_Institution :
Ulyanovsk State Tech. Univ., Ulyanovsk, Russia
Abstract :
The article presents a system for measuring the components of the thermal impedance of semiconductor devices. The principle of operation is based on the heating device polyharmonic power, generated PWM and measures the response to this action - the variable component of the temperature, p-n junction.
Keywords :
p-n junctions; pulse width modulation; semiconductor device measurement; automated system; generated PWM; heating device polyharmonic power; p-n junction; semiconductor devices; thermal impedance component measurement; Semiconductor device measurement;
Conference_Titel :
Actual Problems of Electron Devices Engineering (APEDE), 2012 International Conference on
Conference_Location :
Saratov
Print_ISBN :
978-1-4673-2096-2
DOI :
10.1109/APEDE.2012.6478065
