DocumentCode
3537023
Title
Automated system for the measurement of thermal impedance components of semiconductor devices
Author
Korunov, D.I. ; Smirnov, V.I.
Author_Institution
Ulyanovsk State Tech. Univ., Ulyanovsk, Russia
fYear
2012
fDate
19-20 Sept. 2012
Firstpage
296
Lastpage
297
Abstract
The article presents a system for measuring the components of the thermal impedance of semiconductor devices. The principle of operation is based on the heating device polyharmonic power, generated PWM and measures the response to this action - the variable component of the temperature, p-n junction.
Keywords
p-n junctions; pulse width modulation; semiconductor device measurement; automated system; generated PWM; heating device polyharmonic power; p-n junction; semiconductor devices; thermal impedance component measurement; Semiconductor device measurement;
fLanguage
English
Publisher
ieee
Conference_Titel
Actual Problems of Electron Devices Engineering (APEDE), 2012 International Conference on
Conference_Location
Saratov
Print_ISBN
978-1-4673-2096-2
Type
conf
DOI
10.1109/APEDE.2012.6478065
Filename
6478065
Link To Document