Title :
Universal controlled electronic load for tests of highvoltage instrumentation
Author :
Perevodshikov, V.I. ; Sherbakov, A.V. ; Truhachev, I.M. ; Ybiennih, B.I.
Author_Institution :
State Unitary Firm the All-Russia Electrotech. Inst., Russia
Abstract :
The possibility of using of electron-beam valves of a type €JIB 2/200 in the high-voltage device is offered to attention as a basic element of a controlled bipolar dynamic equivalent load for long-lived or short-lived test of high-voltage devices at voltage of any polarity up to 200 kVs, continuous currents up to 2 A, pulse up to 5 A, power of dissipation up to 400 kWs.
Keywords :
electron beams; electron tubes; high-voltage techniques; test equipment; bipolar dynamic equivalent load control; electron beam valve; high voltage instrumentation testing; high-voltage device; universal controlled electronic load; voltage 200 kV;
Conference_Titel :
Actual Problems of Electron Devices Engineering (APEDE), 2012 International Conference on
Conference_Location :
Saratov
Print_ISBN :
978-1-4673-2096-2
DOI :
10.1109/APEDE.2012.6478068
